AFM-Veeco Dimension 3100
Beeing logic and built in a simple geometry, it is able to do measurements in samples that are heavy and more than 15mm thick.
Still, it is an instrument capable of imaging specimens with a vertical resolution down to a fraction of a nanometer. The instrument works by measuring the deflection produced by a sharp tip on micron-sized cantilever as it scans across the surface of the specimen. Sample sizes that can be handled by the instrument range from small pieces to 150 mm diameter wafers.
The measurements can be handled at the solely solid/gas interface with this instrument.